Share Email Print
cover

Proceedings Paper

IR detector system based on high-Tc superconducting bolometer on Si membrane
Author(s): M. Burnus; G. Hefle; T. Heidenblut; Igor A. Khrebtov; J. Laukemper; W. Michalke; Helmut Neff; B. Schwierzi; Olga K. Semtchinova; Erwin Steinbeiss; A. D. Tkachenko
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An infrared detector system based on high-Tc superconducting (HTS) membrane bolometer is reported. Superconducting transition-edge bolometer has been manufactured by silicon micromachining using an epitaxial GdBa2Cu3O7-x film on an epitaxial yttria- stabilized zirconia buffer layer on silicon. The active area of the element is 0.85 X 0.85 mm2. The membrane thickness is 1 micrometers , those of the buffer layer and HTS films are 50 nm. The detectivity of bolometer, D*, is 3.8 X 109 cm Hz1/2 W-1 at 84.5 K and within the frequency regime 100 < f < 300 Hz. The optical response is 580 V/W at time constant 0.4 ms. This is one of the fastest composite type HTS-bolometer ever reported. The bolometer is mounted on a metal N2-liquid cryostat, which fits the preamplifier. With the volume of N2-reservoir being 0.1 liter, the cryostat holds nitrogen for about 8 hours. Using only wire heater with constant current, the temperature stability of about 0.03 K/h is achieved. The detector system can be used in IR- Fourier spectroscopy at wavelengths longer than the typical operating range of semiconductor detectors (wavelength greater than about 20 micrometers ).

Paper Details

Date Published: 17 June 1996
PDF: 7 pages
Proc. SPIE 2746, Infrared Detectors and Focal Plane Arrays IV, (17 June 1996); doi: 10.1117/12.243057
Show Author Affiliations
M. Burnus, Univ. Hannover (Germany)
G. Hefle, Univ. Hannover (Germany)
T. Heidenblut, Univ. Hannover (Germany)
Igor A. Khrebtov, S.I. Vavilov State Optical Institute (Russia)
J. Laukemper, TZN Forshungs-und Entwicklungszentrum Unterloess Gmb (Germany)
W. Michalke, Institut fuer Physikalische Hochtechnologie (Germany)
Helmut Neff, TZN Forshungs-und Entwicklungszentrum Unterloess Gmb (Denmark)
B. Schwierzi, Univ. Hannover (Germany)
Olga K. Semtchinova, Univ. Hannover (Germany)
Erwin Steinbeiss, Institut fuer Physikalische Hochtechnologie (Germany)
A. D. Tkachenko, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 2746:
Infrared Detectors and Focal Plane Arrays IV
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

© SPIE. Terms of Use
Back to Top