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Proceedings Paper

X-ray photoelectronic spectroscopy on telluride crystal grown in tube with carbon film
Author(s): Su-ying Zhang; Pulin Liu; Jie Shen
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Paper Abstract

II-VI and IV-VI compound semiconductors such as PbTe, CdTe and HgCdTe crystals were grown from melt with a special technique through Carbon Film formed on the wall of quartz tube by the process of Thermal Decomposition (CFTD). The efficiency of CFTD was investigated by means of X-ray Photoelectron Spectroscopy. The results show that the line of Carbon Film is 0.5 eV lower than the line of the graphite. The Carbon film can avoid the contamination and the sticking between the quartz tube and the crystal. The comparative study of the quartz tube wall with the CFTD and those without CFTD, the tube wall before crystallization and those after crystallization and the surface of the crystals grown in the tubes was conducted separately. The results agree with the measuring of the Auger electron spectrum.

Paper Details

Date Published: 17 June 1996
PDF: 4 pages
Proc. SPIE 2746, Infrared Detectors and Focal Plane Arrays IV, (17 June 1996); doi: 10.1117/12.243051
Show Author Affiliations
Su-ying Zhang, Shanghai Institute of Technical Physics (China)
Pulin Liu, Shanghai Institute of Technical Physics (China)
Jie Shen, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 2746:
Infrared Detectors and Focal Plane Arrays IV
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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