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Proceedings Paper

Progress on the development of multiwavelength imaging pyrometer
Author(s): Michael B. Kaplinsky; Jun Li; Nathaniel J. McCaffrey; Edwin Sui Hoi Hou; Walter F. Kosonocky
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Paper Abstract

Experimental Multi-wavelength Imaging Pyrometer (M-WIP) is presented for remote sensing of temperature profiles of targets with unknown spectrally varying emissivity. A software package was developed for calibration and real-time M-WIP measurements. An experimental 7-filter line-sensing M- WIP system was implemented with a 320 X 122-element PtSi IR-CCD imager and an assembly of narrow-band striped IR filters in the spectral range from 1797 nm through 4512 nm. The M-WIP system was calibrated against a commercial blackbody source over temperature range from 450 degree(s)C to 950 degree(s)C. The signal processing included background subtraction, compensation for variation of dark current with detected signal and correction for non-linearities of IR imager response. Initial M-WIP measurements demonstrated real-time temperature resolution (Delta) T of +/- 1 degree(s)C for blackbody target over temperature range from 600 degree(s)C to 900 degree(s)C. Temperature resolution of +/- 4 degree(s)C was demonstrated for the blackbody source viewed through the double polished silicon wafer with unknown spectral transmissivity in the temperature range from 500 degree(s)C to 950 degree(s)C.

Paper Details

Date Published: 17 June 1996
PDF: 12 pages
Proc. SPIE 2746, Infrared Detectors and Focal Plane Arrays IV, (17 June 1996); doi: 10.1117/12.243039
Show Author Affiliations
Michael B. Kaplinsky, New Jersey Institute of Technology (United States)
Jun Li, New Jersey Institute of Technology (United States)
Nathaniel J. McCaffrey, New Jersey Institute of Technology (United States)
Edwin Sui Hoi Hou, New Jersey Institute of Technology (United States)
Walter F. Kosonocky, New Jersey Institute of Technology (United States)

Published in SPIE Proceedings Vol. 2746:
Infrared Detectors and Focal Plane Arrays IV
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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