Share Email Print
cover

Proceedings Paper

Edge-diffraction effects in RCS predictions and their importance in systems analysis
Author(s): W. F. Friess; D. Klement; M. Ruppel; Volker Stein
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In developing RCS prediction codes a variety of physical effects such as the edge diffraction effect have to be considered with the consequence that the computer effort increases considerably. This fact limits the field of application of such codes, especially if the RCS data serve as input parameters for system simulators which very often need these data for a high number of observation angles and/or frequencies. Vice versa the issues of a system analysis can be used to estimate the relevance of physical effects under system viewpoints and to rank them according to their magnitude. This paper tries to evaluate the importance of RCS predictions containing an edge diffracted field for systems analysis. A double dihedral with a strong depolarizing behavior and a generic airplane design containing many arbitrarily oriented edges are used as test structures. Data of the scattered field are generated by the RCS computer code SIGMA with and without including edge diffraction effects. These data are submitted to the code DORA to determine radar range and radar detectibility and to a SAR simulator code to generate SAR imagery. In both cases special scenarios are assumed. The essential features of the computer codes in their current state are described, the results are presented and discussed under systems viewpoints.

Paper Details

Date Published: 17 June 1996
PDF: 12 pages
Proc. SPIE 2742, Targets and Backgrounds: Characterization and Representation II, (17 June 1996); doi: 10.1117/12.243017
Show Author Affiliations
W. F. Friess, DLR (Germany)
D. Klement, DLR (Germany)
M. Ruppel, DLR (Germany)
Volker Stein, DLR (Germany)


Published in SPIE Proceedings Vol. 2742:
Targets and Backgrounds: Characterization and Representation II
Wendell R. Watkins; Dieter Clement, Editor(s)

© SPIE. Terms of Use
Back to Top