Share Email Print
cover

Proceedings Paper

Development of a projectile spin counter and orientation sensor
Author(s): Bradford S. Davis; Mark Clymer; Glenn Graves
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The performance of many tactical sensor systems, especially inertial measurement units (IMUs), suffers when operating in the presence of spin. Sensor Applications has developed a magnetic field sensor, or spin counter, that is capable of switching once per revolution through the earth's magnetic field. The miniature sensor, which eventually will consist of a single ASIC chip, uses the properties of giant magnetoresistance ratio (GMR) materials. The sensor has been designed so that it is immune to local field strength variations. A spin sensor could aid or replace other sensing systems by providing a true measurement of the projectile's roll rate and by determining up from down, which is a very important factor for inertially navigated munitions. High-g shock tests and gyroscopic tests of the sensor have been performed by the U.S. Army Research Laboratory (ARL) to characterize its performance at conditions produced by artillery projectiles. Helmholtz coil testing of the sensor exposed to differing magnetic field conditions was also investigated by Sensor Applications. Initial test results look promising. This paper describes the development of the spin counter, summaries the test results, and discusses the many benefits of this sensor.

Paper Details

Date Published: 17 June 1996
PDF: 9 pages
Proc. SPIE 2742, Targets and Backgrounds: Characterization and Representation II, (17 June 1996); doi: 10.1117/12.243009
Show Author Affiliations
Bradford S. Davis, Army Research Lab. (United States)
Mark Clymer, Sensor Applications (United States)
Glenn Graves, Sensor Applications (United States)


Published in SPIE Proceedings Vol. 2742:
Targets and Backgrounds: Characterization and Representation II
Wendell R. Watkins; Dieter Clement, Editor(s)

© SPIE. Terms of Use
Back to Top