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Proceedings Paper

Growth and characterization of semiconducting Fe-Si2 thin layers on Si(111)
Author(s): Angela Rizzi; Heiko D. Moritz; Hans Luth
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Paper Details

Date Published: 1 March 1991
PDF: 7 pages
Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24298
Show Author Affiliations
Angela Rizzi, Forschungszentrum Juelich GmbH (Germany)
Heiko D. Moritz, Forschungszentrum Juelich GmbH (Germany)
Hans Luth, Forschungszentrum Juelich GmbH (Germany)


Published in SPIE Proceedings Vol. 1361:
Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization

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