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Proceedings Paper

Optimization of fringe pattern scheme registration in moire topography
Author(s): A. M. Popov; V. B. Zinovjev; A. V. Kolesnikov
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Paper Abstract

The new equations, which describe the relation between the characteristics of optical scheme, sensibility and the depth of focus in moire topography, were obtained. Possibility of optimization of the registration scheme of fringe pattern was discussed. The examples of method application, in which the grating is projected on the investigated surface and this surface with image of that grating are projected to the reference grating, are presented. The examples show a good agreement between relief measured by the proposed methods and by independent means.

Paper Details

Date Published: 10 June 1996
PDF: 6 pages
Proc. SPIE 2791, Photomechanics '95, (10 June 1996); doi: 10.1117/12.242104
Show Author Affiliations
A. M. Popov, Siberian State Transport Academy (Russia)
V. B. Zinovjev, Siberian State Transport Academy (Russia)
A. V. Kolesnikov, Siberian State Transport Academy (Russia)


Published in SPIE Proceedings Vol. 2791:
Photomechanics '95

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