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Proceedings Paper

Compact airborne staring FPA sensor with microscanning
Author(s): John G. Sanders; William H. Wan; Van Harris; David Newton; George Tylinski; Mark Wolschon; Joseph J. Imamura
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Paper Abstract

As staring focal plane array (FPA) detectors become more readily available, imaging IR sensors can be constructed in more compact packages that are lighter and consume less power than first or second generation scanning IR sensor packages. However, FPA detector-based imagers typically demonstrate reduced resolution when compared to scanning systems with similar instantaneous-field-of-view. This resolution limitation is created by a the active pixel size and the spatially synchronous scene sampling native to staring FPA systems. A technique called microscanning can be used to improve the resolution of staring systems by over-sampling the scene; moving the image of the scene on the detector in a controlled fashion. This paper presents a compact MWIR staring FPA airborne forward looking infrared sensor design using microscanning for resolution improvement.

Paper Details

Date Published: 10 June 1996
PDF: 11 pages
Proc. SPIE 2743, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VII, (10 June 1996); doi: 10.1117/12.241958
Show Author Affiliations
John G. Sanders, FLIR Systems, Inc. (United States)
William H. Wan, FLIR Systems, Inc. (United States)
Van Harris, FLIR Systems, Inc. (United States)
David Newton, FLIR Systems, Inc. (United States)
George Tylinski, FLIR Systems, Inc. (United States)
Mark Wolschon, FLIR Systems, Inc. (United States)
Joseph J. Imamura, FLIR Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 2743:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VII
Gerald C. Holst, Editor(s)

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