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Proceedings Paper

Real-time three-dimensional infrared scene generation utilizing commercially available hardware
Author(s): Dennis L. Garbo; Eric M. Olson; Charles F. Coker; Dennis R. Crow
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Paper Abstract

Real-time infrared (IR) scene generation for HardWare-In- the-Loop (HWIL) testing is a complicated problem. As a consequence, real-time signal phenomenology and real-time sensor effects modeling have been difficult to accomplish. For example, modern systems are burdened with designation, discrimination, identification, tracking, and aimpoint selection tasks. This requires that sensor data rates increase and therefore faster computations for real-time scene generation systems are necessary in testing environments. Moreover, commercial scene generation hardware is rapidly improving making it a viable solution for HWIL applications in the Kinetic Kill Vehicle Hardware-in-the- Loop Simulator facility. This paper presents the primary analysis performed to determine the strengths and weaknesses of using commercially available hardware and software for real-time scene generation in support of HWIL testing. Finding the appropriate solution to real-time IR scene generation requires striking a balance between physical accuracy and image framing rates. This effort is to determine rendering accuracy and speed for target models which begin as a point source during acquisition and develop into an extended source representation during aimpoint selection.

Paper Details

Date Published: 24 May 1996
PDF: 13 pages
Proc. SPIE 2741, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing, (24 May 1996); doi: 10.1117/12.241095
Show Author Affiliations
Dennis L. Garbo, Science Applications International Corp. (United States)
Eric M. Olson, Science Applications International Corp. (United States)
Charles F. Coker, Air Force Wright Lab. (United States)
Dennis R. Crow, Kinetics, Inc. (United States)

Published in SPIE Proceedings Vol. 2741:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing
Robert Lee Murrer Jr., Editor(s)

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