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Proceedings Paper

Characterization of resists and antireflective coatings by spectroscopic ellipsometry in the UV and deep-UV range
Author(s): Pierre Boher; Jean-Philippe Piel; Christophe Defranoux; Jean-Louis P. Stehle; Louis Hennet
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Paper Abstract

Antireflective coatings and resists are characterized precisely by spectroscopic ellipsometry from 800nm to UV and deep UV 193nm. A procedure based on the use of a polynomial dispersion law to take into account the optical indexes of the ARC in the region where it is transparent is developed and tested on samples with different thicknesses. The values obtained by this procedure are shown to be in perfect agreement with grazing x-ray reflection measurements made on the same samples. The procedure is valid even for very thin ARC. We show that using this thickness, the optical indexes can be extracted directly in all the wavelength range of the SE measurements. Practical example including a top ARC, a resist and a bottom ARC is analyzed in the same way. The physical parameters of the entire trilayer structure are deduced at the different working wavelengths. The expected reflectance performance are simulated using the same physical model and the same software.

Paper Details

Date Published: 7 June 1996
PDF: 13 pages
Proc. SPIE 2726, Optical Microlithography IX, (7 June 1996); doi: 10.1117/12.240988
Show Author Affiliations
Pierre Boher, SOPRA SA (France)
Jean-Philippe Piel, SOPRA SA (France)
Christophe Defranoux, SOPRA SA (France)
Jean-Louis P. Stehle, SOPRA SA (France)
Louis Hennet, Univ. Henri Poincare (France)


Published in SPIE Proceedings Vol. 2726:
Optical Microlithography IX
Gene E. Fuller, Editor(s)

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