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Proceedings Paper

Some comparative results of two approaches in computer simulation of electron lenses for streak image tubes
Author(s): Valentina P. Degtyareva; Valentin Ya. Ivanov; A. M. Ignatov; Sergey V. Kolesnikov; Yu. V. Kulikov; Mikhail A. Monastyrski; Hanben Niu; Mikhail Ya. Schelev
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Paper Abstract

The results of two different approaches in simulation of image converter tube electron optics are given. The first approach is based on aberrations technique, and the second one is connected with trajectories analysis. To compare the efficiency of both techniques we have chosen an electron-optical system of the very well- known time analysing image-converter tube of PVOO1 type. Our digital results reveal much higher calculation stability for the aberration technique when the latter was used for calculation of the image tube parameters near the tube axis. For the photocathode points shifted of the tube axis, both approaches exhibit the similar behaviour. Furthermore, for the photocathode peripheral areas the software based on trajectories analysis seems to be more preferable. It is evident that further development of both techniques will provide the same accuracy and calculation stability over the whole photocathode area for various type of electron lenses.

Paper Details

Date Published: 1 April 1991
PDF: 3 pages
Proc. SPIE 1358, 19th Intl Congress on High-Speed Photography and Photonics, (1 April 1991); doi: 10.1117/12.24055
Show Author Affiliations
Valentina P. Degtyareva, General Physics Institute (Russia)
Valentin Ya. Ivanov, Mathematical Institute (Russia)
A. M. Ignatov, General Physics Institute (Russia)
Sergey V. Kolesnikov, General Physics Institute (Russia)
Yu. V. Kulikov, General Physics Institute (Russia)
Mikhail A. Monastyrski, General Physics Institute (Russia)
Hanben Niu, Xian Institute of Optics and Precision Mechanics (China)
Mikhail Ya. Schelev, General Physics Institute (Russia)

Published in SPIE Proceedings Vol. 1358:
19th Intl Congress on High-Speed Photography and Photonics
Peter W. W. Fuller, Editor(s)

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