Share Email Print

Proceedings Paper

Measurement of nonlinear index by a relay-imaged top-hat z-scan technique
Author(s): Tsutomu Shimada; Norman A. Kurnit; Mansoor Sheik-Bahae
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Measurement of the nonlinear index of a number of materials of interest for the National Ignition Facility have been performed at 1064 nm and 355 nm by a modified version of the `top-hat' Z-scan technique and the results compared with the more standard gaussian-beam Z- scan technique. The top-hat technique has the advantages of higher sensitivity and smaller uncertainties introduced by beam-quality considerations. We have made what we feel to be an additional improvement by placing the defining aperture for the top hat at the front focal plane of the lens that focuses the beam into the sample and then reimaging the input aperture with a second lens onto a ccd camera. Reimaging eliminates diffraction fringes and provides a stationary image even for a wedged sample; recording the entire image permits minimization of spurious effects such as varying interference fringes.

Paper Details

Date Published: 27 May 1996
PDF: 9 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240425
Show Author Affiliations
Tsutomu Shimada, Los Alamos National Lab. (United States)
Norman A. Kurnit, Los Alamos National Lab. (United States)
Mansoor Sheik-Bahae, Univ. of New Mexico (United States)

Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top