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Proceedings Paper

Correlation between laser and mechanical strength of KDP-type crystals
Author(s): L. V. Atroschenko; Marina I. Kolybayeva; Vitaly I. Salo; N. V. Khodeyeva
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Paper Abstract

Several mec1nisms o laser damage o waLer soluble KDP type crystals have been suggested by now, each of them corresponding to one or another aspect o a nonresonance interaction o radiation with material. However, no su.Uicient attention has been rocuseci on the correlation Q the laser damage threshold o crystals with other stn.icture — sensitive properties .The authors were rlrst to 1nc1 a correlation between laser and mechanical strength o DP and. KD*P crystals arid the way or their increase. The statistic processing of the results of measuring laser damage tbresholcl (W) and. fregile strength (a) for several tens of samples showed. a direct dependence between these two most important characteristics. For the KDP crystals doped with lead the rise of a I .5 times Is accompanied by the increase of W 3.7 times as compared with the undopeci ones. The crystals doped with chromium demonstrated the decrease of W almost by an order at a simu.ltaneou.s lowering of a I .7 times. The isothermal annealing of crystals near the temperature of the phase transition from the tetragorial modification to the rnonoclinic one results in both W and. a rise. An explanation of the mechanical strengthening of the material and. its correlation with laser damage threshold Is given in this paper.

Paper Details

Date Published: 27 May 1996
PDF: 1 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240419
Show Author Affiliations
L. V. Atroschenko, Institute for Single Crystals (Ukraine)
Marina I. Kolybayeva, Institute for Single Crystals (Ukraine)
Vitaly I. Salo, Institute for Single Crystals (Ukraine)
N. V. Khodeyeva, Institute for Single Crystals (Ukraine)


Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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