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Proceedings Paper

AFM-mapped nanoscale absorber-driven laser damage in UV high-reflector multilayers
Author(s): Semyon Papernov; Ansgar W. Schmid; J. Anzelotti; Douglas J. Smith; Z. Roman Chrzan
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Paper Abstract

Submicrometer lateral-size craters that develop independently of the presence of micron-scale growth nodules and whose number density follows the intensity profile of the full laser beam are the dominant laser-damage features in 351-nm high-reflector production coatings on the University of Rochester's 60-beam OMEGA laser. Coupled with the observation that the smallest measured damage craters allow for initiating absorber sizes not larger than 10 nm, the experimental evidence points toward randomly distributed nano-cluster absorbers as the sources for energy transfer from the optical field to the porous film medium.

Paper Details

Date Published: 27 May 1996
PDF: 11 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240395
Show Author Affiliations
Semyon Papernov, Univ. of Rochester (United States)
Ansgar W. Schmid, Univ. of Rochester (United States)
J. Anzelotti, Univ. of Rochester (United States)
Douglas J. Smith, Univ. of Rochester (United States)
Z. Roman Chrzan, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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