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Proceedings Paper

Advances in the practical application of schlieren photography in industry
Author(s): Horst R. Herbrich
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Paper Abstract

The handling of schlieren investigation equipment as well as the image recording technique has been improved. In the past, the object to be investigated usually had to be brought to the permanently installed schlieren apparatus, a procedure which was often not only complicated but even costly. Two schlieren methods (the parallel beam and coincidence beam principle) have been modified in such a way that they can be used in the form of portable equipment on-the-spot wherever needed. This also makes it simple to carry out schlieren investigations on bulky (stationary) objects, for example in the industrial development and production sectors. For the quantitative analysis of schlieren movements (e.g. path/time analyses for measuring speed), the slit and knife edge should be arranged perpendicular to the direction of schlieren movement in order to obtain accurate measuring results. With the majority of schlieren equipment, adaptation of the slit and knife edge position to a different direction of schlieren movement involves time-consuming adjustment work. This cannot be done while an image is being recorded. For this reason, a schlieren investigation apparatus (coincidence principle) is described with which these disadvantages are obviated. The slit and knife edge position can be adapted to a different direction of the Schlieren during a video or film recording without any adjustment being necessary. This is made possible due to the fact that the light source, condensing lens, slit and knife edge set-up can be revolved by 360 degrees around the optical axis of the sperical analyzing mirror.

Paper Details

Date Published: 1 April 1991
PDF: 5 pages
Proc. SPIE 1358, 19th Intl Congress on High-Speed Photography and Photonics, (1 April 1991); doi: 10.1117/12.24039
Show Author Affiliations
Horst R. Herbrich, Industriefilm (Germany)


Published in SPIE Proceedings Vol. 1358:
19th Intl Congress on High-Speed Photography and Photonics
Peter W. W. Fuller, Editor(s)

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