Share Email Print
cover

Proceedings Paper

Photothermal study of optical components at 10.6 μm: finite element calculations and experiments
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Up to now theoretical calculations of the photothermal response of optical components have only been performed using analytical approximations of the adequate thermo-mechanical equations. In contrast, this paper presents finite-element (FE) calculations for the description of the photothermal behavior of optical components at 10.6 micrometers . The FE-analysis allows the calculation of the surface temperature- and deformation-profile for bare substrates and two additional coating layers with respect to their thermo-optical properties. Also the behavior of the interfaces (substrate-coating, coating layer1 - coating layer2) can be calculated. These FE- model calculations of the photothermal response were performed with respect to the thermal properties and absorption characteristics of the coating and substrate respectively. The results are compared to experimental results obtained using the photothermal deflection technique (PDT). Additionally, the FE-model used allows the calculation of the time resolved response of the optical component to pulsed irradiation. The calculations of the temporal behavior are studied for a pulsed PDT situation and are compared to measurements. The results can also be used to determine the heat conductivity of the coatings of optical components. Some measurements and comparisons with the calculations are shown and discussed in detail.

Paper Details

Date Published: 27 May 1996
PDF: 10 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240371
Show Author Affiliations
Rene Krupka, Univ. Stuttgart (Germany)
Adolf Giesen, Univ. Stuttgart (Germany)


Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top