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Proceedings Paper

Ultrasensitive detection of photothermal signal of thin films by using an optical amplification system
Author(s): S. T. Gu; Zhouling Wu; Peter Diehr; Y. S. Lu; Pao-Kuang Kuo
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Paper Abstract

A simple optical amplification system is introduced to improve the sensitivity of both the photothermal deflection detection scheme and the surface thermal lensing technique. Model calculations and experimental data show that the photothermal signals can be easily amplified by more than an order of magnitude and that the technique can be readily applied to weak absorption measurements for optical thin film coatings.

Paper Details

Date Published: 27 May 1996
PDF: 9 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240368
Show Author Affiliations
S. T. Gu, Eastern Michigan Univ. (United States)
Zhouling Wu, Eastern Michigan Univ. (United States)
Peter Diehr, Eastern Michigan Univ. (United States)
Y. S. Lu, Wayne State Univ. (United States)
Pao-Kuang Kuo, Wayne State Univ. (United States)


Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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