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Proceedings Paper

Influence of the number of double layers on the damage threshold of Al2O3/SiO2 and LaF3/MgF2 mirrors at 248 nm
Author(s): Eric Eva; Klaus R. Mann; Uwe B. Schallenberg; Norbert Kaiser; Rainer Henking; Detlev Ristau
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Paper Abstract

KrF-laser induced damage thresholds (LIDT) of HR stacks were investigated as a function of the number of quarterwave layers. The findings were interpreted in terms of calorimetric absorption measurements and scatter defect density counts as well as an analysis of the standing wave electric field. Higher numbers of high-purity Al2O3/SiO2 layers resulted in enhanced LIDT by shielding the substrate surface increasingly well. Contrary to this, LIDT decreased with increasing numbers of e-beam evaporated LaF3/MgF2 layers. This was accompanied by elevated absorptance, defect density and conditionability at higher stack numbers.

Paper Details

Date Published: 27 May 1996
PDF: 12 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240365
Show Author Affiliations
Eric Eva, Laser-Lab. Goettingen eV (Germany)
Klaus R. Mann, Laser-Lab. Goettingen eV (Germany)
Uwe B. Schallenberg, Fraunhofer Institut fuer Angewandte Optik und Feinmechanik (Germany)
Norbert Kaiser, Fraunhofer Institut fuer Angewandte Optik und Feinmechanik (Germany)
Rainer Henking, Laser Zentrum Hannover eV (Germany)
Detlev Ristau, Laser Zentrum Hannover eV (Germany)


Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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