Share Email Print
cover

Proceedings Paper

Accuracy and precision of laser damage measurements made via binary search techniques
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper presents an estimation of the accuracy and precision for several variants of the binary search technique for the determination of laser damage threshold. First the variants of the binary search technique are introduced. Next a normalized version of the defect ensemble model is introduced. A Monte Carlo calculation is made using the normalized probability distribution and the four BST variants. The results are analyzed to yield the median and upper limit on the measured threshold for various number of spots tested. It is shown that there is a rapid increase in the accuracy and precision of the test with increasing numbers of spots included. Also shown are performance differences among the test BST protocols under examination. The paper concludes with rules of thumb for making accurate measurements via the BST.

Paper Details

Date Published: 27 May 1996
PDF: 10 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240358
Show Author Affiliations
Jonathan W. Arenberg, TRW Space & Electronics Group (United States)


Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top