Share Email Print
cover

Proceedings Paper

Contamination damage in pulsed 1-um lasers
Author(s): Floyd E. Hovis; Bart A. Shepherd; Christopher T. Radcliffe; Henry A. Maliborski
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Although thin film coating technology has evolved to the point that damage thresholds of several hundred MW/cm2 can be routinely achieved, sealed laser systems which must be operated for extended times or at elevated temperatures frequently experience failure due to optical damage. This damage, which is frequently due to the build up of gas phase contaminants in the sealed optical compartment, occurs in spite of the fact that the lasers were designed such that the intracavity intensities are only a few tens of MW/cm2. Since much of our work involves designing Q-switched Nd:YAG lasers that operates over extreme environmental conditions, eliminating contamination damage at 1 micrometers is of particular interest to us. In this paper we will describe our current understanding of contamination induced damage at 1 micrometers and give an overview of the processes that can be used to eliminate such damage in fielded systems.

Paper Details

Date Published: 27 May 1996
PDF: 10 pages
Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); doi: 10.1117/12.240348
Show Author Affiliations
Floyd E. Hovis, Litton Systems, Inc. (United States)
Bart A. Shepherd, Litton Systems, Inc. (United States)
Christopher T. Radcliffe, Litton Systems, Inc. (United States)
Henry A. Maliborski, Litton Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 2714:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top