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Proceedings Paper

Sub-0.35-um critical dimension metrology using atomic force microscopy
Author(s): Kathryn Guarini; Bhanwar Singh; William H. Arnold
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Paper Abstract

The critical dimension atomic force microscope (CD-AFM) provides a number of unique capabilities for in-line metrology. In this paper, we evaluate the CD-AFM as a metrology tool and discuss its capabilities and limitations for semiconductor process development and production. We report that linewidth measurements made by the CD-AFM correlate well with those made by all other techniques generally used to measure submicron features, including scanning electron microscopy and electrical probing. Measurement repeatability is limited primarily by changes in probe tip shape with increased use. When the tip is accurately calibrated, this tool provides width, height, and slope data on etched and photoresist features with nanometer resolution. Increased throughput and improved automation may make the CD- AFM a key metrology tool for next-generation process development.

Paper Details

Date Published: 21 May 1996
PDF: 15 pages
Proc. SPIE 2725, Metrology, Inspection, and Process Control for Microlithography X, (21 May 1996); doi: 10.1117/12.240111
Show Author Affiliations
Kathryn Guarini, Advanced Micro Devices (United States)
Bhanwar Singh, Advanced Micro Devices (United States)
William H. Arnold, Advanced Micro Devices (United States)


Published in SPIE Proceedings Vol. 2725:
Metrology, Inspection, and Process Control for Microlithography X
Susan K. Jones, Editor(s)

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