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Proceedings Paper

Fluorescence lifetime imaging in cell biology
Author(s): Brian Herman; Xue F. Wang; Ammasi Periasamy; Seongwook Kwon; Gerald W. Gordon; Pawel Wodnicki
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Paper Abstract

The measurement of fluorescence lifetimes offers the advantages of being independent of local intensity and concentration of the fluorophore, and can provide information regarding the molecular environment in a single living cell. Historically, measurements of fluorescence lifetimes have employed photomultipliers as detectors, providing high sensitivity but sacrificing spatial information. Fluorescence Lifetime Imaging Microscopy (FLIM) provides a 2- or 3D spatial map of the distribution of fluorescent lifetime(s) in the sample under observation. Picosecond laser pulses from a tunable dye laser are delivered to fluorophore containing living cells on the stage of a fluorescent microscope, and images of the fluorescence emission at various times during the decay of the fluorescence lifetime are collected using a high speed nanosecond-gated multichannel plate image intensifier. FLIM promises to substantially enhance the information obtainable from living cells and tissues, and will allow observations of the dynamic organization and interaction of cellular components on a spatial and temporal scale previously not possible using other microscopic techniques.

Paper Details

Date Published: 10 May 1996
PDF: 10 pages
Proc. SPIE 2678, Optical Diagnostics of Living Cells and Biofluids, (10 May 1996); doi: 10.1117/12.239553
Show Author Affiliations
Brian Herman, Univ. of North Carolina/Chapel Hill (United States)
Xue F. Wang, Univ. of North Carolina/Chapel Hill (United States)
Ammasi Periasamy, Univ. of North Carolina/Chapel Hill (United States)
Seongwook Kwon, Univ. of North Carolina/Chapel Hill (United States)
Gerald W. Gordon, Univ. of North Carolina/Chapel Hill (United States)
Pawel Wodnicki, Univ. of North Carolina/Chapel Hill (United States)


Published in SPIE Proceedings Vol. 2678:
Optical Diagnostics of Living Cells and Biofluids
Daniel L. Farkas; Robert C. Leif; Alexander V. Priezzhev; Toshimitsu Asakura; Bruce J. Tromberg, Editor(s)

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