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Laser trapping and phase conjugate microscopy for micromanipulation and image processing
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Paper Abstract

We report the implementation of an optical laser trap that incorporates phase conjugate microscopy as one of its key elements. The laser trap consists of a primary trapping beam, and a counterpropagating self-pumped phase conjugate beam, the latter being derived from the primary signalbeam when it is transmitted through the sample and phase conjugated in a photorefractive crystal. Using a fundamental TEM00 gaussian beam from an Ar-ion laser (514 nm), and a barium titanate (BaTiO3) crystal in the CAT (total internal reflection) geometry, an optical laser trap was created using approximately 25 mW of laser power. Strong transverse optical confinement is reported for approximately 2.5 micrometers diameter polystyrene microspheres, using both high and low numerical aperture (e.g. 60 X, 0.85 N.A. and 10 X, 0.25 N.A.) objective lenses. By virtue of the phase conjugation process, the present geometry achieves self-alignment of the two counter-propagating beams, as well as photorefractive gain in the ratio of nearly 4:1. The system has the potential for implementing several novel image processing functions unique to the nonlinear phase conjugation process, on living cells confined to an optical laser trap, including aberration correction, contrast reversal, and novelty filtering, respectively.

Paper Details

Date Published: 10 May 1996
PDF: 8 pages
Proc. SPIE 2678, Optical Diagnostics of Living Cells and Biofluids, (10 May 1996); doi: 10.1117/12.239498
Show Author Affiliations
Gregory J. Sonek, Beckman Laser Institute and Medical Clinic (United States)
Wen Wang, Beckman Laser Institute and Medical Clinic (United States)
Arthur E. T. Chiou, Rockwell International Science Ctr. (United States)
Michael W. Berns, Beckman Laser Institute and Medical Clinic (United States)

Published in SPIE Proceedings Vol. 2678:
Optical Diagnostics of Living Cells and Biofluids
Daniel L. Farkas; Robert C. Leif; Alexander V. Priezzhev; Toshimitsu Asakura; Bruce J. Tromberg, Editor(s)

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