Share Email Print
cover

Proceedings Paper

Novel CCD structures of high sensitivity
Author(s): Evgeni V. Kostyukov; Andre A. Pugachev; Victor A. Shilin; Alexander V. Veto
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new class of charge-coupled devices called junction virtual phase (JVP) CCD's is described. JVP CCDs have very high photosensitivity because their pixels are designed without any metal or polysilicon gates. A new principle of buried channel modulation through a narrow depleted layer is used. This principle is realized in a few JVP structures. Two dimensional simulation of these structures are presented.

Paper Details

Date Published: 8 April 1996
PDF: 7 pages
Proc. SPIE 2790, Fifth Conference on Charge-Coupled Devices and CCD Systems, (8 April 1996); doi: 10.1117/12.238217
Show Author Affiliations
Evgeni V. Kostyukov, Pulsar Science Research Institute (Russia)
Andre A. Pugachev, Pulsar Science Research Institute (Russia)
Victor A. Shilin, Pulsar Science Research Institute (Russia)
Alexander V. Veto, Pulsar Science Research Institute (Russia)


Published in SPIE Proceedings Vol. 2790:
Fifth Conference on Charge-Coupled Devices and CCD Systems
Vladimir A. Karasev; Yuri A. Kuznetsov; Victor A. Shilin, Editor(s)

© SPIE. Terms of Use
Back to Top