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Proceedings Paper

Simple model for CCD yield
Author(s): Arkadi N. Markov
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Paper Abstract

A simple equation for CCD yield depending on the technological environment condition is derived. An approach demonstrated can be generalized to analyze the yield relating problems for many kinds of ICs.

Paper Details

Date Published: 8 April 1996
PDF: 4 pages
Proc. SPIE 2790, Fifth Conference on Charge-Coupled Devices and CCD Systems, (8 April 1996); doi: 10.1117/12.238206
Show Author Affiliations
Arkadi N. Markov, Russian Fund TOPEK (Russia)


Published in SPIE Proceedings Vol. 2790:
Fifth Conference on Charge-Coupled Devices and CCD Systems
Vladimir A. Karasev; Yuri A. Kuznetsov; Victor A. Shilin, Editor(s)

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