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Proceedings Paper

Electrical noise in MIM structures
Author(s): Ivan Ostadal; Libor Lecko
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Paper Abstract

Sandwich MIM structures Al/Al2O3/Au were measured before and after electroforming. I-V characteristics and noise of leakage and emission currents were measured in vacuum at various temperatures. Calculated power spectra of current noise of white, Lorentzian and 1/fa type reflect relaxation processes and dominating conduction mechanisms at various applied voltages.

Paper Details

Date Published: 8 April 1996
PDF: 4 pages
Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); doi: 10.1117/12.238129
Show Author Affiliations
Ivan Ostadal, Charles Univ. (Czech Republic)
Libor Lecko, Charles Univ. (Czech Republic)

Published in SPIE Proceedings Vol. 2780:
Metal/Nonmetal Microsystems: Physics, Technology, and Applications
Benedykt W. Licznerski; Andrzej Dziedzic, Editor(s)

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