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Proceedings Paper

Electrical conduction in discontinuous metal thin films
Author(s): James E. Morris
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Paper Abstract

This paper has three objectives. For those who have no prior knowledge of discontinuous thin metal film research, it serves to introduce the basic concepts of electrical conduction in such structures, i.e., electron tunneling between discrete metal islands, with an associated activation energy of electrostatic origin. In addition, some of the properties and potential applications which continue to drive research in the field are summarized. For those with greater familiarity with the field, the objective is to argue for the concept of contact injection of charge carriers as a fundamental basis of the conduction mechanism. The argument is based on the observation of asymmetric electrode effects with both ac and dc properties. The primary difficulty in both research and application of such films lies with drift and lack of reproducibility, problems which may now be resolved by use of the scanning tunneling microscope (STM) or atomic force microscope (AFM) for structural control.

Paper Details

Date Published: 8 April 1996
PDF: 8 pages
Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); doi: 10.1117/12.238125
Show Author Affiliations
James E. Morris, SUNY/Binghamton (United States)


Published in SPIE Proceedings Vol. 2780:
Metal/Nonmetal Microsystems: Physics, Technology, and Applications

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