Share Email Print
cover

Proceedings Paper

Trainable rule-based network for irradiation field recognition in Agfa's ADC system
Author(s): Piet Dewaele; Michael Ibison; Pieter Vuylsteke
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The irradiation field is the diagnostic region of radiograph which has been exposed directly to x rays and has not been shielded from the source by x-ray opaque material. Such material may have been placed to shield vulnerable regions of the patient from unnecessary exposure, and also to partition the radiograph into sub-images, thereby permitting multiple exposures on the same plate. In this paper we describe an image analysis method to automatically detect and locate the irradiation field of a digital radiograph. The aim is to prepare the radiographic image for contrast-enhancement processing which is driven only by exposure data from the diagnostically useful part of the radiograph. The algorithm is broadly edge-based, and comprises four stages: (1) edge detection, culminating in a set of straight-line edge segments as non-iconic data structures; (2) clustering (where possible) these segments into longer lines in accordance with colinearity constraints and the like; (3) model matching by a trainable rule- based network to identify irradiation field boundaries; (4) masking, which acts upon the input image to blank out the regions not in the irradiation field. The network has been trained on a database of 2100 images, and has been tested in clinical use, delivering an accuracy for recognition of the irradiation field of better than 99%.

Paper Details

Date Published: 11 April 1996
PDF: 13 pages
Proc. SPIE 2708, Medical Imaging 1996: Physics of Medical Imaging, (11 April 1996); doi: 10.1117/12.237836
Show Author Affiliations
Piet Dewaele, Agfa-Gevaert NV (Belgium)
Michael Ibison, Agfa-Gevaert NV (Belgium)
Pieter Vuylsteke, Agfa-Gevaert NV (Belgium)


Published in SPIE Proceedings Vol. 2708:
Medical Imaging 1996: Physics of Medical Imaging
Richard L. Van Metter; Jacob Beutel, Editor(s)

© SPIE. Terms of Use
Back to Top