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Proceedings Paper

Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor
Author(s): David M. Pepper; Gilmore J. Dunning; Phillip V. Mitchell; Stephen William McCahon; Marvin B. Klein; Thomas R. O'Meara
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Paper Abstract

We demonstrate the use of a nonsteady-state photo-induced-emf adaptive photodetector as a robust, low-cost laser ultrasonic sensor. This class of sensor enables high-fractional bandwidth ultrasound detection and, in addition, all-optical compensation of adverse in-factory noise, including vibration, speckle, relative platform motion, and optical fiber modal dispersion. Reference-beam and fiber-based time-delay interferometric configurations were demonstrated, as well as the use of a diode laser as a compact optical probe.

Paper Details

Date Published: 8 April 1996
PDF: 12 pages
Proc. SPIE 2703, Lasers as Tools for Manufacturing of Durable Goods and Microelectronics, (8 April 1996); doi: 10.1117/12.237768
Show Author Affiliations
David M. Pepper, Hughes Research Labs. (United States)
Gilmore J. Dunning, Hughes Research Labs. (United States)
Phillip V. Mitchell, Hughes Research Labs. (United States)
Stephen William McCahon, Hughes Research Labs. (United States)
Marvin B. Klein, Hughes Research Labs. (United States)
Thomas R. O'Meara, Hughes Research Labs. (United States)

Published in SPIE Proceedings Vol. 2703:
Lasers as Tools for Manufacturing of Durable Goods and Microelectronics
Jan J. Dubowski; Jyotirmoy Mazumder; Leonard R. Migliore; Chandrasekhar Roychoudhuri; Ronald D. Schaeffer, Editor(s)

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