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Proceedings Paper

Use of in-situ dielectric sensing for intelligent processing and health monitoring
Author(s): D. Kranbuehl; H. Aandahl; Nicole M. Haralampus-Grynaviski; W. Newby; David Hood; G. Boiteux; Gerard Seytre; Jean Pierre Pascault; Abderrahim Maazouz; J. F. Gerard; H. Sautereau; J. F. Chailan; Alfred C. Loos; J. D. MacRae
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Paper Abstract

Frequency dependent dielectric measurements (FDEMS) provide a sensitive, automated in situ sensor for intelligent processing and an in situ means for monitoring durability, that is degradation of polymers during use. FDEMS in situ sensors can be designed and calibrated to monitor changes in processing properties during fabrication and changes in mechanical or electrical service life properties of polymer materials during use. With a proper understanding of the type of polymer and the use environment, the sensor output can be related to changes in modulus, maximum load and elongation at break. The FDEMS technique has advantages over other monitoring techniques: nondestructive; accuracy/reproductivity; sensitivity; in situ capability; remote sensing; automated.

Paper Details

Date Published: 26 April 1996
PDF: 6 pages
Proc. SPIE 2779, 3rd International Conference on Intelligent Materials and 3rd European Conference on Smart Structures and Materials, (26 April 1996); doi: 10.1117/12.237095
Show Author Affiliations
D. Kranbuehl, College of William and Mary (United States)
H. Aandahl, College of William and Mary (United States)
Nicole M. Haralampus-Grynaviski, College of William and Mary (United States)
W. Newby, College of William and Mary (United States)
David Hood, College of William and Mary (United States)
G. Boiteux, Univ. Lyon I (France)
Gerard Seytre, Univ. Lyon I (France)
Jean Pierre Pascault, Univ. Lyon I (France)
Abderrahim Maazouz, Univ. Lyon I (France)
J. F. Gerard, Univ. Lyon I (France)
H. Sautereau, Univ. Lyon I (France)
J. F. Chailan, Univ. Lyon I (France)
Alfred C. Loos, Virginia Polytechnic Institute and State Univ. (United States)
J. D. MacRae, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 2779:
3rd International Conference on Intelligent Materials and 3rd European Conference on Smart Structures and Materials
Pierre Francois Gobin; Jacques Tatibouet, Editor(s)

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