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Proceedings Paper

Time of flight mass spectrometry of the laser produced fragments
Author(s): Sergey Sergeivich Alimpiev; Sergey M. Nikiforov; A. K. Dudojan; V. Y. Shevtshenko
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Paper Abstract

The application of reflectron time of flight mass spectrometry or analyzing the products of laser induced thin films modification and YBa2 Cu3 0 _ in bulk ablat ion is discussed . The measurements of threshol Xlaser fluences and fragment velocity distribution are presented.

Paper Details

Date Published: 1 October 1990
PDF: 12 pages
Proc. SPIE 1352, 1st Intl School on Laser Surface Microprocessing, (1 October 1990); doi: 10.1117/12.23705
Show Author Affiliations
Sergey Sergeivich Alimpiev, General Physics Institute (Russia)
Sergey M. Nikiforov, General Physics Institute (Russia)
A. K. Dudojan, General Physics Institute (Russia)
V. Y. Shevtshenko, General Physics Institute (Russia)

Published in SPIE Proceedings Vol. 1352:
1st Intl School on Laser Surface Microprocessing
Ian W. Boyd; Vitali I. Konov; Boris S. Luk'yanchuk, Editor(s)

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