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Proceedings Paper

Object reconstruction with intensity correlations: signal-to-noise ratio calculation
Author(s): Yiping Z. Hu; Arvind S. Marathay; Paul S. Idell
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Paper Abstract

Second-, third-, and fourth-order intensity correlations measured in the field in the pupil plane are used to construct the amplitude and phase of the two-dimensional mutual coherence function. Information about the noncoherent object is derived by a two-dimensional spatial Fourier transform of the mutual coherence function. A computer simulation of the Fourier domain laser speckle patterns is used to provide data from which the expected second-, third-, and fourth-order intensity correlations are computed. These correlations are used in the program for the explicit reconstruction of the phase. In addition, the signal-to-noise ratio (SNR) is discussed with reference to the measured integrated intensity, ?0TI(t)dt, as compared to the theoretically assumed instantaneous intensity,I(t). The study of the SNR for the second-, third-, and fourth-order intensity correlations involves higher-order intensity correlations. With the assumed Gaussian statistics of the wave amplitude, the analytical expressions for the higher-order correlations are algebraically complex. The SNR for the third-order case is discussed. For further development, symbolic manipulation programs (e.g., DERIVE, MATHEMATICA, or MACSYMA) will be used. The discussion of the signal-to-noise ratio applies to intensity correlation interferometry (low light levels) for which the integration time, T, is large compared to the coherence time, ?c, that is, T >> ?c. We will consider the case for laser speckle interferometry for which ?c » T in our follow-up work.

Paper Details

Date Published: 1 November 1990
PDF: 4 pages
Proc. SPIE 1351, Digital Image Synthesis and Inverse Optics, (1 November 1990); doi: 10.1117/12.23668
Show Author Affiliations
Yiping Z. Hu, Optical Sciences Ctr./Univ. of (United States)
Arvind S. Marathay, Optical Sciences Ctr./Univ. of (United States)
Paul S. Idell, Weapons Lab. (United States)


Published in SPIE Proceedings Vol. 1351:
Digital Image Synthesis and Inverse Optics
Arthur F. Gmitro; Paul S. Idell; Ivan J. LaHaie, Editor(s)

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