Share Email Print
cover

Proceedings Paper

Integrated optic sensor for measuring aflatoxin-B1 in corn
Author(s): Anthony A. Boiarski; James R. Busch; R. S. Brody; Richard W. Ridgway; Wolf P. Altman; C. Golden
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An integrated optic refractometer device was developed to perform a rapid one-step, homogeneous immunoassay. The device measures refractive index changes at the surface of a planar, singlemode, ion-exchange waveguide using difference interferometry. Anti-aflatoxin- B1 antibodies were attached to the waveguide surface to provide a bioselective coating for detecting and quantifying the aflatoxin-B1 antigen level in a sample. The detection limit of this small antigen must be determined using a competitive assay format. To determine feasibility of the competitive assay, we determined the biosensor response to a larger molecular weight competing antigen, namely HRP-labeled aflatoxin-B1. This labeled antigen will compete with unlabeled aflatoxin for binding sites on the sensor surface. Increased sample aflatoxin levels will result in a decreased time-dependent phase change of the helium-neon laser light beam. Phase change data were determined for various concentration levels of HRP-labeled aflatoxin- B1 antigen. The assay measurements were made over a 5-minute time period. Results indicated that a competitive assay is feasible. Future assay efforts should be able to demonstrate measurement of aflatoxin-B levels found in contaminated corn samples.

Paper Details

Date Published: 25 March 1996
PDF: 8 pages
Proc. SPIE 2686, Integrated Optics and Microstructures III, (25 March 1996); doi: 10.1117/12.236140
Show Author Affiliations
Anthony A. Boiarski, BioSense Consulting (United States)
James R. Busch, Battelle Memorial Institute/Columbus Div. (United States)
R. S. Brody, Battelle Memorial Institute/Columbus Div. (United States)
Richard W. Ridgway, Battelle Memorial Institute/Columbus Div. (United States)
Wolf P. Altman, Battelle Memorial Institute/Columbus Div. (United States)
C. Golden, Editek Inc. (United States)


Published in SPIE Proceedings Vol. 2686:
Integrated Optics and Microstructures III
Massood Tabib-Azar, Editor(s)

© SPIE. Terms of Use
Back to Top