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Proceedings Paper

Image sensing with programmable offset pixels for increased dynamic range of more than 150 dB
Author(s): Oliver Vietze; Peter Seitz
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Paper Abstract

A novel CMOS active pixel sensor structure has been designed, fabricated and characterized. It greatly increases the working range for all imaging applications in which the optical signal information to be detected is superimposed on a large DC offset signal. This is achieved by subtracting an offset current at each pixel's photosite. The offset current can be programmed individually by an external programming voltage. Experimental results from a single pixel test-cell fabricated on a standard 2 (mu) CMOS-process show a programmable offset signal range of > 150 dB with a dynamic range of > 60 dB of the photo detector itself. To achieve a similar performance using conventional imaging techniques would require an imager with a dynamic range of > 150 dB.

Paper Details

Date Published: 25 March 1996
PDF: 6 pages
Proc. SPIE 2654, Solid State Sensor Arrays and CCD Cameras, (25 March 1996); doi: 10.1117/12.236088
Show Author Affiliations
Oliver Vietze, Paul Scherrer Institute Zurich (Switzerland)
Peter Seitz, Paul Scherrer Institute Zurich (Switzerland)


Published in SPIE Proceedings Vol. 2654:
Solid State Sensor Arrays and CCD Cameras
Constantine N. Anagnostopoulos; Morley M. Blouke; Michael P. Lesser, Editor(s)

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