Share Email Print

Proceedings Paper

Experiments on the pattern recognition system for validation and security verification
Author(s): Bahram Javidi; Guanshen Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Experiments on an optical pattern recognition system used for validation and security verification are provided. The system verifies a random phase mask bonded to a gray scale primary image. Using a limited set of images, the system performance is investigated in the presence of different types of input noise and distortions such as scratches, fingerprints, and bendings. The experimental results indicate that for the noise and the distortion tested here, the system provides a good correlation performance by verifying the phase mask.

Paper Details

Date Published: 15 March 1996
PDF: 5 pages
Proc. SPIE 2659, Optical Security and Counterfeit Deterrence Techniques, (15 March 1996); doi: 10.1117/12.235453
Show Author Affiliations
Bahram Javidi, Univ. of Connecticut (United States)
Guanshen Zhang, Univ. of Connecticut (United States)

Published in SPIE Proceedings Vol. 2659:
Optical Security and Counterfeit Deterrence Techniques
Rudolf L. van Renesse, Editor(s)

© SPIE. Terms of Use
Back to Top