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Proceedings Paper

IR frequency analysis in paper industry
Author(s): Matti Laehdeniemi; Ari Ekholm; Osmo Santamaki
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Paper Abstract

IR monitoring is a basic tool for quality control and predictive maintenance in the paper industry. There are also other possible interests, e.g. measurements of temperature profiles of high speed production lines. The first possibility to use IR for the above mentioned use appears to be applications of glass heat treatment in on line production. At this time there is a lot of interest to be able to measure temperature profiles from a fast moving surface (e.g. in paper machines) with velocities like 10 - 20 m/s. Normal low speed line scanners typically give scanning speed of 50 Hz which in this case means 20 m/s/50 Hz equals 40 cm resolution. The obtained resolution is not normally high enough. To have more accurate vision from the studied surface IR camera line scanning was proposed to be a solution with line scanning frequencies of 8000 Hz which would provide resolution of 20 m/s/8000 Hz equals 0.25 cm between surface points. It is a well-known fact that all undesired frequencies in paper transfer systems disturb the uniform paper drying process which in some cases is the basic reason for low quality coating or even broken paper line. The possibility to detect these drying problems with IR frequency analysis will give a new way to control the paper drying process. With IR analysis it is possible to get information about temperature distributions along the paper track. Using a well established frequency analysis as a tool, the error estimations are obtained. In most cases an open-roll image from paper track is very desirable because there are no existing wide area measurement systems for this purpose. The careful analysis of this new method is given in the manuscript.

Paper Details

Date Published: 15 March 1996
PDF: 3 pages
Proc. SPIE 2766, Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (15 March 1996); doi: 10.1117/12.235391
Show Author Affiliations
Matti Laehdeniemi, Tampere Univ. of Technology (Finland)
Ari Ekholm, Satakunta Polytechnic (Finland)
Osmo Santamaki, Tampere Univ. of Technology (Finland)

Published in SPIE Proceedings Vol. 2766:
Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
Douglas D. Burleigh; Jane W. Maclachlan Spicer, Editor(s)

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