Share Email Print

Proceedings Paper

Computational pulse shaping for thermographic inspections
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The thermographic inspection of materials and structures typically involves the application of a heat flux to the surface and measuring the subsequent surface temperature profiles. The nature of typical heat flux sources requires the incident flux has the shape of either a short pulse or a step function. This pulse shape for the flux typically will not maximize the contrast between a response from a flaw in the structure and the unflawed regions of the structure. Optimal shaping of the pulse is experimentally difficult, if not impossible. However, its consideration serves as a useful tool for developing post-processing techniques for the data. The concept is to design filters for processing the data in a manner that emulates shaping the input flux. Convolving the measured thermal response with this optimized filter effectively maps the measured response to the response for an optimally shaped input heat flux. A method for generating this filter is presented. Applying the filter to the thermal response of the structure increases the contrast between flawed and unflawed regions. Results with experimental data illustrate the advantages of the technique over conventional techniques.

Paper Details

Date Published: 15 March 1996
PDF: 8 pages
Proc. SPIE 2766, Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (15 March 1996); doi: 10.1117/12.235379
Show Author Affiliations
William P. Winfree, NASA Langley Research Ctr. (United States)
K. Elliott Cramer, NASA Langley Research Ctr. (United States)

Published in SPIE Proceedings Vol. 2766:
Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
Douglas D. Burleigh; Jane W. Maclachlan Spicer, Editor(s)

© SPIE. Terms of Use
Back to Top