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Proceedings Paper

Analysis methods for full-field time-resolved infrared radiometry
Author(s): Robert Osiander; Jane W. Maclachlan Spicer; John C. Murphy
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Paper Abstract

A data analysis procedure is described to enable quantitative information about defect depth and surface and subsurface thermal properties to be obtained from the time series of images acquired in a time-resolved infrared radiometry (TRIR) measurement. While the approaches described have been previously considered for single point measurements, in this work the algorithms are applied to full field images. As a result, images presenting defect depth and amount of thermal mismatch at subsurface interfaces can be constructed. Results are presented for composite test panels with flat-bottomed holes milled to different depths, two-layer specimens with differing thermal properties between the top layer and the substrate and a graphite/epoxy-honeycomb composite panel with simulated delaminations.

Paper Details

Date Published: 15 March 1996
PDF: 10 pages
Proc. SPIE 2766, Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (15 March 1996); doi: 10.1117/12.235378
Show Author Affiliations
Robert Osiander, Johns Hopkins Univ. (United States)
Jane W. Maclachlan Spicer, Johns Hopkins Univ. (United States)
John C. Murphy, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 2766:
Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
Douglas D. Burleigh; Jane W. Maclachlan Spicer, Editor(s)

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