Share Email Print

Proceedings Paper

Voltage imaging(TM) for L-contact panel testing
Author(s): Ying-Moh Liu; Francois Henley; Mike Miller; Jack Salerno
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Applications of the Voltage ImagingTM technique in testing active arrays used in AMLCDs have been widely discussed. Voltage ImagingTM is well known for its simplicity in interfacing with active array panels, and its superior voltage measurement accuracy and repeatability. It is also known for having broad test applicability for many AMLCD panel design technologies, such as TFT, MIM, diode and panels with integrated drivers. This paper briefly discusses a recent improvement related to the application of Voltage ImagingTM for L-contact panel testing. As the panel manufacturers are trying to reduce the manufacturing cost, the number of panels on one substrate also increases which, in several cases, leaves only enough room to add ESD protection shorting rings on two of the four sides of a panel. Since this is the trend of the industry, a methodology that can be employed to test L-contact panels with Voltage ImagingTM is presented in this paper.

Paper Details

Date Published: 11 March 1996
PDF: 4 pages
Proc. SPIE 2651, Liquid Crystal Materials, Devices, and Applications IV, (11 March 1996); doi: 10.1117/12.235345
Show Author Affiliations
Ying-Moh Liu, Photon Dynamics Inc. (United States)
Francois Henley, Photon Dynamics Inc. (United States)
Mike Miller, Photon Dynamics Inc. (United States)
Jack Salerno, Photon Dynamics Inc. (United States)

Published in SPIE Proceedings Vol. 2651:
Liquid Crystal Materials, Devices, and Applications IV
Ranganathan Shashidhar, Editor(s)

© SPIE. Terms of Use
Back to Top