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Proceedings Paper

Thin-plates test with modified IT-200 Fizeau interferometer
Author(s): Alexis V. Kudryashov; Vadim V. Samarkin; A. A. Lukashev; O. V. Yunyakov
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Paper Abstract

The results of the test of the flatness and wedge of thin quartz plates with the help of a modified interferometer Fizeau are presented. The suggested scheme of the interferometer allows us to get and process two interferograms without any adjustment of the tested element. The accuracy of the suggested methods is not less than lambda/10 (lambda equals 0.6 micron).

Paper Details

Date Published: 1 March 1996
PDF: 2 pages
Proc. SPIE 2713, Fifth International Conference on Industrial Lasers and Laser Applications '95, (1 March 1996); doi: 10.1117/12.234240
Show Author Affiliations
Alexis V. Kudryashov, Scientific Research Ctr. for Technological Lasers (Russia)
Vadim V. Samarkin, Scientific Research Ctr. for Technological Lasers (Russia)
A. A. Lukashev, Moscow State Univ. (Russia)
O. V. Yunyakov, AS Crystal (Russia)


Published in SPIE Proceedings Vol. 2713:
Fifth International Conference on Industrial Lasers and Laser Applications '95
Vladislav Ya. Panchenko; Vladimir S. Golubev, Editor(s)

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