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Intensified multispectral imaging measuring in the spatial, frequency, and time domains with a single instrument
Author(s): Benjamin J. Kennedy
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Paper Details

Date Published: 1 January 1991
PDF: 7 pages
Proc. SPIE 1346, Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90, (1 January 1991); doi: 10.1117/12.23385
Show Author Affiliations
Benjamin J. Kennedy, Xybion Electronic Systems Corp. (United States)


Published in SPIE Proceedings Vol. 1346:
Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90
Paul A. Jaanimagi; Barry T. Neyer; Larry L. Shaw, Editor(s)

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