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Proceedings Paper

Lateral-periodicity evaluation of multilayer Bragg reflector surface roughness using x-ray diffraction
Author(s): Hisataka Takenaka; Yoshikazu Ishii
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Paper Abstract

The lateral-periodicities of the surface and interfacial roughnesses of a multilayer- Bragg reflector which affect x-ray reflectivity have been examined using the x-ray rocking curve profile measurements and a stylus surface profilometer. Multilayered films have been fabricated by a proprietary sputtering technique. The x-ray rocking curve profiles of the first Bragg reflection of the multilayered films have been examined with a precision x-ray diffractometer. These profiles show that the lateral-periodicity of the film surface and interfacial roughness which primarily affect the CuKa X-ray reflectivity is about 4 rim. The measured CuKa x-ray reflectivity of the multilayered film is in good agreement with calculations which incorporate the estimated film surface and interfacial roughness. 1.

Paper Details

Date Published: 1 January 1991
PDF: 9 pages
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); doi: 10.1117/12.23313
Show Author Affiliations
Hisataka Takenaka, NTT Corp. (Japan)
Yoshikazu Ishii, NTT Corp. (Japan)

Published in SPIE Proceedings Vol. 1345:
Advanced X-Ray/EUV Radiation Sources and Applications
James P. Knauer; Gopal K. Shenoy, Editor(s)

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