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Proceedings Paper

Finite thickness effect of a zone plate on focusing hard x-rays
Author(s): Wenbing Yun; John J. Chrzas; P. James Viccaro
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Paper Abstract

Spatial resolution and focusing efficiency are two important properties of a zone plate in x-ray focusing applications. A general expression of the zone plate equation describing its zone registration is derived from the interference of spherical waves emited from two mutually coherent point sources. An analytical expression of the focusing efficiency in terms of the zone plate thickness and x-ray refractive indices of the zones is also derived. Validity condition for using this expression is considered. Thickness required for obtaining adequate focusing efficiency is calculated as a function of x-ray energy for several representative materials. The spatial resolution of a finite thickness zone plate is worse than that of an infinetly thin zone plate which is approximately equal to the smallest zone width of the zone plate. The effect of the finite thickness on the spatial resolution is considered. This manuscript has been authored under contract number W-31-109-ENG-38 with the U. S. Department of Energy. Accordingly the U. S. Government retains a non-exclusive royalty-free license to publish or reproduce the published form of this contribution or allow others todo so for U. S. Government purposes. 146 / SPIE Vol 1345 Advanced X-Ray/EUV Radiation Sources andApplications(1990)

Paper Details

Date Published: 1 January 1991
PDF: 19 pages
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); doi: 10.1117/12.23311
Show Author Affiliations
Wenbing Yun, Argonne National Lab. (United States)
John J. Chrzas, Argonne National Lab. (United States)
P. James Viccaro, Univ. of Chicago (United States)

Published in SPIE Proceedings Vol. 1345:
Advanced X-Ray/EUV Radiation Sources and Applications
James P. Knauer; Gopal K. Shenoy, Editor(s)

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