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Proceedings Paper

Model-supported exploitation of synthetic aperture radar images
Author(s): Rama Chellappa; Shyam Kuttikkad; Reuven Meth; Philippe Burlina; Chandra S. Shekhar
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Paper Abstract

We address the application of model-supported exploitation techniques to synthetic aperture radar (SAR) imagery. The emphasis is on monitoring SAR imagery using wide area 2D and/or 3D site models along with contextual information. We consider here the following tasks useful in monitoring: (a) site model construction using segmentation and labeling techniques, (b) target detection, (c) target classification and indexing, and (d) SAR image-site model registration. The 2-D wide area site models used here for SAR image exploitation differ from typical site models developed for RADIUS applications, in that they do not model specific facilities, but constitute wide area site models of cultural features such as urban clutter areas, roads, clearings, fields, etc. These models may be derived directly from existing site models, possibly constructed from electro-optical (EO) observations. When such models are not available, a set of segmentation and labeling techniques described here can be used for the construction of 2D site models. The use of models can potentially yield critical information which can disambiguate target signatures in SAR images. We address registration of SAR and EO images to a common site model. Specific derivations are given for the case of registration within the RCDE platform. We suggest a constant false alarm rate (CFAR) detection scheme and a topographic primal sketch (TPS) based classification scheme for monitoring target occurrences in SAR images. The TPS of an observed target is matched against candidate targets TPSs synthesized for the preferred target orientation, inferred from context (e.g. road or parking lot targets). Experimental results on real and synthetic SAR images are provided.

Paper Details

Date Published: 19 February 1996
PDF: 11 pages
Proc. SPIE 2645, 24th AIPR Workshop on Tools and Techniques for Modeling and Simulation, (19 February 1996); doi: 10.1117/12.233056
Show Author Affiliations
Rama Chellappa, Univ. of Maryland/College Park (United States)
Shyam Kuttikkad, Univ. of Maryland/College Park (United States)
Reuven Meth, Univ. of Maryland/College Park (United States)
Philippe Burlina, Univ. of Maryland/College Park (United States)
Chandra S. Shekhar, Univ. of Maryland/College Park (United States)


Published in SPIE Proceedings Vol. 2645:
24th AIPR Workshop on Tools and Techniques for Modeling and Simulation
Donald J. Gerson, Editor(s)

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