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Proceedings Paper

Power distribution from insertion device x-ray sources
Author(s): P. James Viccaro
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Paper Abstract

Insertion device (ID) synchrotron x-ray sources on present day and next-generation synchrotron facilities have very attractive spectral properties. In addition however they are capable of producing x-ray beams with large powers and in some cases unprecedented power densities. An overview of the spatial and frequency distributions of these sources including the effects of synchrotron particle beam emittance is presented. 1.

Paper Details

Date Published: 1 January 1991
PDF: 10 pages
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); doi: 10.1117/12.23298
Show Author Affiliations
P. James Viccaro, Univ. of Chicago (United States)


Published in SPIE Proceedings Vol. 1345:
Advanced X-Ray/EUV Radiation Sources and Applications
James P. Knauer; Gopal K. Shenoy, Editor(s)

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