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Proceedings Paper

Development of a low-contamination camera head for the evaluation of CCDs in the UV and EUV
Author(s): Lawrence Shing; Robert A. Stern
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Paper Abstract

A low contamination vacuum chamber and camera head built to test the ultraviolet and extreme ultraviolet response of charge-coupled devices are described. The vacuum chamber is of all electropolished stainless steel construction with copper seal flanges used throughout. The camera head includes a liquid-nitrogen-cooled, resistively heated thermal control system (+/- 0.1 C), and a specially recast epoxy ZIF socked. All electronic components, except wiring, are kept outside of the vacuum, eliminating major sources of organic contamination. The system is turbopumped and reaches pressures of about 10 exp -8 torr. Residual gas analysis of the system shows that partial pressures of organic contaminants are less than about 10 exp -9 torr.

Paper Details

Date Published: 1 November 1990
PDF: 6 pages
Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23282
Show Author Affiliations
Lawrence Shing, Lockheed Palo Alto Research Lab. (United States)
Robert A. Stern, Lockheed Palo Alto Research Lab. (United States)


Published in SPIE Proceedings Vol. 1344:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Oswald H. W. Siegmund; Hugh S. Hudson, Editor(s)

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