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Proceedings Paper

New approach to the study of microchannel-plate-sensitive surface
Author(s): Michael A. Gruntman
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Paper Abstract

A new approach to study the composition of microchannel plate sensitive surface by secondary ion mass spectrometry is described. The time-of-flight technique is implemented in an unconventional way which permits using the continuous probing beam and concurrent multichannel mass identification. This makes the technique relatively simple, and the low doses and low probing beam intensities provide the opportunity to perform nondestructive analysis of thin layers and fragile films.

Paper Details

Date Published: 1 November 1990
PDF: 7 pages
Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23281
Show Author Affiliations
Michael A. Gruntman, Univ. of Southern California (United States)

Published in SPIE Proceedings Vol. 1344:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Oswald H. W. Siegmund; Hugh S. Hudson, Editor(s)

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