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Investigation of structured head diffraction gratings for linear optical encoder
Author(s): A. Y. Zherdev; S. B. Odinokov; M. S. Kovalev; D. S. Lushnikov; V. V. Markin; M. V. Shishova; N. G. Stsepuro
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Paper Abstract

Optical position encoders working according to the interference method consists of a measurement scale and a measuring head moving along each other. The scale has a reflection diffraction grating on its surface and the measuring head has a transmission diffraction grating with same period inside. Laser light passing and diffracting through these two gratings creates an interference signal on an optical detector. Decoding of the interference signal phase allows to determinate current position. Known optical position encoders use complex optical schemes and some phase optical elements to form several quadrature signals with different phase for higher encoder accuracy. Previously we researched such kind of schemes [1, 2]. In this paper we propose to use a common optical scheme without phase elements but with a complex structured measuring head grating for this purpose to simplify an optical scheme and alignment requirements. The optical scheme of position encoder based on measuring head grating with specific structure is research and described in this paper.

Paper Details

Date Published: 2 November 2018
PDF: 7 pages
Proc. SPIE 10818, Holography, Diffractive Optics, and Applications VIII, 108181B (2 November 2018); doi: 10.1117/12.2326998
Show Author Affiliations
A. Y. Zherdev, Bauman Moscow State Technical Univ. (Russian Federation)
S. B. Odinokov, Bauman Moscow State Technical Univ. (Russian Federation)
M. S. Kovalev, Bauman Moscow State Technical Univ. (Russian Federation)
D. S. Lushnikov, Bauman Moscow State Technical Univ. (Russian Federation)
V. V. Markin, Bauman Moscow State Technical Univ. (Russian Federation)
M. V. Shishova, Bauman Moscow State Technical Univ. (Russian Federation)
N. G. Stsepuro, Bauman Moscow State Technical Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 10818:
Holography, Diffractive Optics, and Applications VIII
Yunlong Sheng; Chongxiu Yu; Changhe Zhou, Editor(s)

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