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Proceedings Paper

Quantitative measurement of embedding depth of internal defect using phase-shifting dual-observation digital shearography
Author(s): Guoqing Gu; Xing Xu; Chengchun Qiu; Fei Zhang; Guizhong Xu
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Paper Abstract

Aiming at achieving quantitative detection of internal defect in materials, this work employs phase-shifting dualobservation digital shearography for determining embedding depth of internal defects in a nondestructive way. Firstly, a mechanical model of internal defect is established based on the principles of elastic mechanics. An analytical solution about embedding depth is hereby obtained. Then, dual-observation digital shearography is used for measuring the firstorder derivative of out-of-plane displacement at the region with defect. Consequently, the embedding depth of internal defect is determined by combining theoretical formula and experimental results obtained from shearogram. Finally, the measurement accuracy of embedding depth using proposed method is validated by comparison with another two commonly used methods. The measurement error of embedding depth is less than 5%, which completely confirms higher accuracy of the proposed method.

Paper Details

Date Published: 2 November 2018
PDF: 6 pages
Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190Z (2 November 2018); doi: 10.1117/12.2326956
Show Author Affiliations
Guoqing Gu, Yancheng Institute of Technology (China)
Xing Xu, Shenzhen Orbbec Co., Ltd. (China)
Chengchun Qiu, Yancheng Institute of Technology (China)
Fei Zhang, Yancheng Institute of Technology (China)
Guizhong Xu, Yancheng Institute of Technology (China)


Published in SPIE Proceedings Vol. 10819:
Optical Metrology and Inspection for Industrial Applications V
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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