Share Email Print
cover

Proceedings Paper • new

High-resolution charge domain TDI-CMOS image sensor for Earth observation
Author(s): Jérôme Pratlong; Georgios Tsiolis; Hyun Jung Lee; Vincent Arkesteijn; Paul Donegan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Earth observation (EO) is a rapidly expanding area of space science and technology, fueled by the demands for timely, comprehensive and informative data for an increasing number of applications. With the increased affordability of satellites EO is becoming accessible to a larger pool of commercial developers and users. Presently there does not exist in the market a low cost payload with the performance required to meet the growing demands of the commercial ‘New Space’ EO market (very high resolution, good quality image, low mass and low recurrent cost). The presentation will discuss the characterization results of a novel TDI-CMOS silicon prototype as well as a description of the current flight model design currently being developed under the CEOI EO technology and Instrumentation program funded by the UK Space Agency. This sensor will be a key enabling technology for the high resolution new space payload.

Paper Details

Date Published: 25 September 2018
PDF: 10 pages
Proc. SPIE 10785, Sensors, Systems, and Next-Generation Satellites XXII, 107850X (25 September 2018); doi: 10.1117/12.2326778
Show Author Affiliations
Jérôme Pratlong, Teledyne e2v UK Ltd. (United Kingdom)
Georgios Tsiolis, Teledyne e2v UK Ltd. (United Kingdom)
Hyun Jung Lee, Teledyne-Dalsa (Canada)
Vincent Arkesteijn, Teledyne-Dalsa (Netherlands)
Paul Donegan, Teledyne-Dalsa (Canada)


Published in SPIE Proceedings Vol. 10785:
Sensors, Systems, and Next-Generation Satellites XXII
Steven P. Neeck; Philippe Martimort; Toshiyoshi Kimura, Editor(s)

© SPIE. Terms of Use
Back to Top